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EE 539 Reliability Engineering for Integrated Circuits 3 Credits
Description of the algorithms and procedures required to study the reliability of integrated circuit products. Reliability modeling, physical causes of semiconductor device failure, reliability model development and calibration, model-based reliability prediction, product testing and measurement, and failure diagnosis. Coverage of the course material will emphasize applications to integrated circuit technology.
Last Offered Terms Course Name SU Credit
Prerequisite: __
Corequisite: __
ECTS Credit: 10 ECTS (10 ECTS for students admitted before 2013-14 Academic Year)
General Requirements: