The course will treat electron optics and diffraction physic as a basis for the advanced course. It will go into the construction and functions of different types of electron microscopes and detectors. The largest portion of the course is devoted to analyzing materials and their defects with the help of electron optics and diffraction physics. A short but essential introduction to analytical electron microscopy and spectroscopic techniques will be given. The course will have 3-4 laboratory exercises to introduce practical issues with the electron microscopy.
Introduction to Electron Microscopy (MAT 571)
Programs\Type | Required | Core Elective | Area Elective |
MA-European Studies | |||
MA-European Studies-Non Thesis | |||
MA-Political Science | |||
MA-Political Science-Non Thes | |||
MA-Visual Arts&Vis. Com Des-NT | |||
MA-Visual Arts&Visual Com Des | |||
MS-Bio. Sci. & Bioeng. LFI | |||
MS-Bio. Sci. & Bioeng. LFI-ENG | |||
MS-Biological Sci&Bioeng. | * | ||
MS-Computer Sci.&Eng. LFI | |||
MS-Computer Sci.&Eng. LFI-ENG | |||
MS-Computer Science and Eng. | * | ||
MS-Cyber Security(with thesis) | * | ||
MS-Data Science | |||
MS-Elec. Eng&Comp Sc.LFI-ENG | |||
MS-Electronics Eng&Comp Sc.LFI | |||
MS-Electronics Eng&Computer Sc | * | ||
MS-Electronics Eng. | * | ||
MS-Electronics Eng. LFI | |||
MS-Electronics Eng. LFI-ENG | |||
MS-Energy Techno.&Man. | * | ||
MS-Industrial Eng. LFI-ENG | |||
MS-Industrial Engineering | * | ||
MS-Industrial Engineering LFI | |||
MS-Manufacturing Eng-Non Thes | * | ||
MS-Manufacturing Engineering | * | ||
MS-Materials Sci & Engineering | * | ||
MS-Materials Sci. & Eng. LFI | |||
MS-Materials Sci.&Eng. LFI-ENG | |||
MS-Mathematics | |||
MS-Mechatronics | * | ||
MS-Mechatronics LFI | |||
MS-Mechatronics LFI-ENG | |||
MS-Physics | |||
MS-Physics-Non Thesis | * | ||
MS-Psychology | |||
MS-Psychology-Non Thesis | |||
PHD-Biological Sci&Bioeng. | * | ||
PHD-Comp. Sci and Eng.after UG | * | ||
PHD-Computer Science and Eng. | * | ||
PHD-Cyber Security | * | ||
PHD-Electronics Eng&ComputerSc | * | ||
PHD-Electronics Eng. | * | ||
PHD-Electronics Eng. after UG | * | ||
PHD-Experimental Psychology | |||
PHD-Industrial Engineering | * | ||
PHD-Management | |||
PHD-Manufacturing Eng after UG | * | ||
PHD-Manufacturing Engineering | * | ||
PHD-Materials Sci.&Engineering | |||
PHD-Mathematics | |||
PHD-Mechatronics | * | ||
PHD-Mechatronics after UG | * | ||
PHD-Physics | |||
PHD-Physics after UG | |||
PHD-Social Psychology | |||
PHDBIO after UG | * | ||
PHDCYSEC after UG | * | ||
PHDEECS after UG | * | ||
PHDEPSY after UG | |||
PHDIE after UG | * | ||
PHDMAN after UG | |||
PHDMAN after UG-Finance | |||
PHDMAN after UG-Man. and Org. | |||
PHDMAN after UG-Op.&Sup. Cha. | |||
PHDMAN-Finance Area | |||
PHDMAN-Man. and Org. Area | |||
PHDMAN-Op. & Supp. Chain Area | |||
PHDMAT after UG | * | ||
PHDMATH after UG | |||
PHDSPSY after UG |
CONTENT
OBJECTIVE
To teach the students the theory and the practice of imaging and diffraction using electrons. Students get formal lectures in imaging in SEM and TEM and diffraction in TEM. They also learn spectral analysis in SEM and TEM. They have to apply what they learn in class to practical use in lab sessions.
LEARNING OUTCOME
AIMS
? To teach the student fundamentals of using electrons in imaging of materials and demonstrate the main differences between Electron Microscopy and Optical Microscopy
? To define the limits of scanning electron microscopy (SEM) and introduce the concepts in transmission electron microscopy (TEM).
? To explain the capabilities and science behind the TEM technique.
INTENDED LEARNING OUTCOMES
1. Module Specific Skills.
By the end of this module, the students should be able to:
(a) Know the working principle of SEM and how images are obtained
(b) Explain the types of interactions between energetic electrons and matter
(c) Define how these interactions are used to carry out spectral analysis
(d) Compare SEM and TEM methods and know each technique?s limitations
2. Discipline Specific Skills.
By the end of this module, the students should:
(e) understand how an electron beam is generated and utilized in imaging
(f) know what type of information one can extract from the interactions between electrons and the sample in the SEM and TEM
(g) comprehend how various detectors work
(h) understand the principle of diffraction and its use in structural characterization.
(i) know the differences between various techniques to obtain different contrasts in the TEM.
3. Individual and Key Skills.
By the end of this module, the students will:
(j) gain an understanding of fundamentals of imaging using electrons
(k) be able to reach a level where they can decide which technique they would use in their research.
(l) relate various types of contrasts in both SEM and TEM to the processes that might have taken place in materials.
(m) be at a level where they will know how to present their results they obtained using electron microscopy in their research.
(s) think and make decisions on the path which will enable them to resolve a given issue.
Update Date:
RECOMENDED or REQUIRED READINGS
Readings |
Goldstein, Newburry, Echlin, Joy, Fiori, and Lifshin, Scanning Electron Microscopy and X-ray Microanalysis, Plenum, NYC. |