NT 506 Advanced Characterization in Nanotechnology Select Term:
This module covers theoretical basics of commonly used advanced materials characterization techniques and case studies of their applications. For each technique a demo session will be given where the working principles of the equipment will be demonstrated, structural and functional materials will be characterized. Focused ion beam imaging, nuclear magnetic resonance and micro-computed tomography are among the techniques that will be covered.
SU Credits : 3.000
ECTS Credit : 6.000
Prerequisite : -
Corequisite : -