MAT 672 Advanced Electron Microscopy : Imaging Select Term:
This course details diffraction physics and electron optics that were introduced in the preceding course in electron microscopy. Special emphasis will be given to defect analysis in conventional transmission electron microscopy and high resolution electron microscopy. The second portion of the course is devoted to analytical electron microscopy using x-ray and electron energy loss spectroscopies.
SU Credits : 3.000
ECTS Credit : 10.000
Prerequisite : -
Corequisite : MAT 672