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EE 539 Reliability Engineering for Integrated Circuits Select Term:
Description of the algorithms and procedures required to study the reliability of integrated circuit products. Reliability modeling, physical causes of semiconductor device failure, reliability model development and calibration, model-based reliability prediction, product testing and measurement, and failure diagnosis. Coverage of the course material will emphasize applications to integrated circuit technology.
SU Credits : 3
ECTS Credit : 10
Prerequisite : -
Corequisite : -