EE 539 Reliability Engineering for Integrated Circuits Select Term:
Description of the algorithms and procedures required to study the reliability of integrated circuit products. Reliability modeling, physical causes of semiconductor device failure, reliability model development and calibration, model-based reliability prediction, product testing and measurement, and failure diagnosis. Coverage of the course material will emphasize applications to integrated circuit technology.
SU Credits : 3.000
ECTS Credit : 10.000
Prerequisite : -
Corequisite : -